jump to navigation

7/19/07 – The Critical Component: Assessment July 24, 2007

Posted by Noelle Archambeau in Best Practices, e-SIG Presentations.

Thanks again to Steven Just, President of Pedagogue Solutions, for his excellent presentation on best practices in test development and validation. Click here to download the slides that Steven used during his presentation.

Steven also referenced a study about the value of repeated testing vs. repeated studying. Click here to read a brief article he wrote about the study.

For those of you interested in learning more about testing, Steven recommends the following two books:
Criterion-referenced Test Development by Sharon Shrock and William Coscarelli
Performance-based Certification by Judith Hale

Our next meeting is on Thursday, August 16th at 6:00 pm at Penn State Great Valley. Catherine Mercer Bing, Executive Vice President, New Business Development, ITAP International and President, ITAP Americas, will talk to us about the impact of culture on learning as well as what professionals need to consider when developing e-learning for global learners.



No comments yet — be the first.

Leave a Reply

Fill in your details below or click an icon to log in:

WordPress.com Logo

You are commenting using your WordPress.com account. Log Out /  Change )

Google+ photo

You are commenting using your Google+ account. Log Out /  Change )

Twitter picture

You are commenting using your Twitter account. Log Out /  Change )

Facebook photo

You are commenting using your Facebook account. Log Out /  Change )


Connecting to %s

%d bloggers like this: